相信大家很多人(ren)聽過安規(gui)(gui)三項測(ce)試，那么為什么要進行安規(gui)(gui)測(ce)試呢？這也是(shi)(shi)眾多人(ren)想問(wen)的一個問(wen)題，可(ke)能最普(pu)遍的回(hui)答是(shi)(shi)“因(yin)為安規(gui)(gui)標準有要求啊”，但若深入了(le)解電氣安規(gui)(gui)的背(bei)(bei)景，便會發現它背(bei)(bei)后所隱含的責任和意義。

Q:什么叫耐壓測試?

A:耐壓(ya)(ya)測(ce)試(shi)(shi)或高壓(ya)(ya)測(ce)試(shi)(shi)(HIPOT測(ce)試(shi)(shi)) ，是(shi)(shi)用來驗證(zheng)產品的(de)(de)質量和電(dian)氣安全(quan)特(te)性(如JSI、CSA、BSI、UL、IEC、TUV等等國際安全(quan)機構所要(yao)求的(de)(de)標準)的(de)(de)一種{bfb}的(de)(de)生產線測(ce)試(shi)(shi)。HIPOT測(ce)試(shi)(shi)是(shi)(shi)確定(ding)電(dian)子絕(jue)緣材料(liao)足(zu)以抵抗瞬間(jian)(jian)高電(dian)壓(ya)(ya)的(de)(de)一個(ge)非破(po)壞性的(de)(de)測(ce)試(shi)(shi)，是(shi)(shi)適用于所有設備為保證(zheng)絕(jue)緣材料(liao)是(shi)(shi)足(zu)夠的(de)(de)的(de)(de)一個(ge)高壓(ya)(ya)測(ce)試(shi)(shi)。進行HIPOT測(ce)試(shi)(shi)的(de)(de)其(qi)它(ta)原因是(shi)(shi)，它(ta)可(ke)以查出可(ke)能(neng)的(de)(de)瑕疵譬如在制造(zao)過程期(qi)間(jian)(jian)造(zao)成(cheng)的(de)(de)漏電(dian)距離和電(dian)氣間(jian)(jian)隙不夠。

Q:為(wei)何要做耐壓測試?

A:正常情況下，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)力(li)系(xi)統中(zhong)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)波形是正弦波。電(dian)(dian)(dian)(dian)(dian)(dian)(dian)力(li)系(xi)統在運行中(zhong)由(you)于雷(lei)擊、操作(zuo)、故障或電(dian)(dian)(dian)(dian)(dian)(dian)(dian)氣(qi)設(she)備的(de)(de)(de)(de)參數(shu)配合不當等(deng)(deng)原因(yin)，引起系(xi)統中(zhong)某些(xie)部分的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)突(tu)然(ran)升高，大(da)大(da)超過(guo)(guo)其(qi)額定電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，這(zhe)就(jiu)是過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)按其(qi)發生的(de)(de)(de)(de)原因(yin)可分為兩大(da)類(lei)，一類(lei)是由(you)于直(zhi)接(jie)雷(lei)擊或雷(lei)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)感(gan)應而(er)引起的(de)(de)(de)(de)過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，稱為外部過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。雷(lei)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)沖(chong)擊電(dian)(dian)(dian)(dian)(dian)(dian)(dian)流和(he)沖(chong)擊電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)的(de)(de)(de)(de)幅值都很大(da)，而(er)且(qie)持(chi)續時間很短(duan)，破壞性極(ji)大(da)。但由(you)于城鎮及一般工業(ye)企(qi)業(ye)內的(de)(de)(de)(de)3-10kV與以下的(de)(de)(de)(de)架(jia)空(kong)線路(lu)，因(yin)受廠房或高大(da)建筑物(wu)的(de)(de)(de)(de)屏蔽保護，所以遭受直(zhi)接(jie)雷(lei)擊的(de)(de)(de)(de)概率很小，比較安全。而(er)且(qie)這(zhe)里討論的(de)(de)(de)(de)是民(min)用電(dian)(dian)(dian)(dian)(dian)(dian)(dian)器，不在上述(shu)范圍內，就(jiu)不進一步討論。另(ling)一類(lei)是因(yin)為電(dian)(dian)(dian)(dian)(dian)(dian)(dian)力(li)系(xi)統內部的(de)(de)(de)(de)能量(liang)轉換或參數(shu)變化引起的(de)(de)(de)(de)，例(li)如切(qie)合空(kong)載線路(lu)，切(qie)斷(duan)空(kong)載變壓(ya)(ya)(ya)器，系(xi)統內發生單相弧光接(jie)地(di)等(deng)(deng)，稱為內部過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。內部過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)是確定電(dian)(dian)(dian)(dian)(dian)(dian)(dian)力(li)系(xi)統中(zhong)各(ge)種電(dian)(dian)(dian)(dian)(dian)(dian)(dian)氣(qi)設(she)備正常絕緣(yuan)水平的(de)(de)(de)(de)主(zhu)要依(yi)據。也就(jiu)是說，產(chan)品(pin)(pin)的(de)(de)(de)(de)絕緣(yuan)結構(gou)的(de)(de)(de)(de)設(she)計不但要考慮(lv)額定電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)而(er)且(qie)要考慮(lv)產(chan)品(pin)(pin)使用環境(jing)的(de)(de)(de)(de)內部過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。耐壓(ya)(ya)(ya)測試就(jiu)是檢測產(chan)品(pin)(pin)絕緣(yuan)結構(gou)是否能夠承受電(dian)(dian)(dian)(dian)(dian)(dian)(dian)力(li)系(xi)統的(de)(de)(de)(de)內部過(guo)(guo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。

Q:AC耐壓測試(shi)有什(shen)么優點(dian)呢?  

A:通常AC 耐(nai)(nai)壓測(ce)(ce)試比(bi)DC耐(nai)(nai)壓測(ce)(ce)試更(geng)容(rong)易獲得安全機(ji)構的接受。主要理由是大多數被測(ce)(ce)物(wu)品將工作于(yu)AC電(dian)(dian)(dian)壓之下，而且AC耐(nai)(nai)壓測(ce)(ce)試更(geng)接近產品在(zai)實際使用中會碰到(dao)的壓力。由于(yu)AC測(ce)(ce)試不會給(gei)容(rong)性負載充(chong)電(dian)(dian)(dian)，從(cong)開始施加電(dian)(dian)(dian)壓到(dao)測(ce)(ce)試結束電(dian)(dian)(dian)流讀數保持(chi)一(yi)致(zhi)。因此，由于(yu)不存在(zai)監視電(dian)(dian)(dian)流讀數所要求的穩定(ding)化(hua)問題，也就(jiu)不需(xu)要逐(zhu)漸升高電(dian)(dian)(dian)壓。這意(yi)味(wei)著，除非(fei)被測(ce)(ce)產品感應到(dao)突然施加的電(dian)(dian)(dian)壓，操作員可(ke)以立即施加全電(dian)(dian)(dian)壓并讀出電(dian)(dian)(dian)流而不用等(deng)待。由于(yu)AC電(dian)(dian)(dian)壓不會給(gei)負載充(chong)電(dian)(dian)(dian)，在(zai)測(ce)(ce)試之后用不著給(gei)被測(ce)(ce)設備放電(dian)(dian)(dian)。

Q:AC耐(nai)壓(ya)測試有什么缺點(dian)呢?

A:在測(ce)試(shi)容(rong)性(xing)負(fu)載時，總(zong)電(dian)(dian)(dian)流由電(dian)(dian)(dian)抗性(xing)電(dian)(dian)(dian)流和泄漏(lou)(lou)電(dian)(dian)(dian)流組成。當電(dian)(dian)(dian)抗性(xing)電(dian)(dian)(dian)流量遠(yuan)(yuan)大(da)(da)于(yu)(yu)真實(shi)泄漏(lou)(lou)電(dian)(dian)(dian)流時，可(ke)能難(nan)于(yu)(yu)測(ce)出(chu)有(you)過量泄漏(lou)(lou)電(dian)(dian)(dian)流的產(chan)品(pin)。在測(ce)試(shi)大(da)(da)容(rong)性(xing)負(fu)載時，所需要的總(zong)電(dian)(dian)(dian)流遠(yuan)(yuan)大(da)(da)于(yu)(yu)泄漏(lou)(lou)電(dian)(dian)(dian)流本身。由于(yu)(yu)操作員面對更大(da)(da)的電(dian)(dian)(dian)流，這可(ke)能是一個更大(da)(da)的危(wei)險。

Q:DC耐(nai)壓測試有什(shen)么優點呢?

A:當被(bei)測(ce)(ce)設備(DUT)充(chong)滿了電，流過的(de)(de)(de)就(jiu)只(zhi)有真(zhen)正的(de)(de)(de)泄(xie)(xie)漏電流。這使DC耐壓(ya)(ya)測(ce)(ce)試(shi)器能夠清楚地(di)顯(xian)示出被(bei)測(ce)(ce)產(chan)品的(de)(de)(de)真(zhen)正泄(xie)(xie)漏電流。由于充(chong)電電流是短暫的(de)(de)(de)，DC耐壓(ya)(ya)測(ce)(ce)試(shi)器的(de)(de)(de)功(gong)率要求通常可以比用來測(ce)(ce)試(shi)同(tong)樣(yang)產(chan)品的(de)(de)(de)AC耐壓(ya)(ya)測(ce)(ce)試(shi)器的(de)(de)(de)功(gong)率要求小得(de)多。

Q:DC耐(nai)壓(ya)測試儀有(you)什(shen)么缺點呢?

A:由于DC耐壓測(ce)試(shi)(shi)的確給(gei)被(bei)測(ce)物(DUT)充電(dian)(dian)(dian)，為了xx在(zai)耐壓測(ce)試(shi)(shi)后處置被(bei)測(ce)物(DUT) 之操作員觸電(dian)(dian)(dian)的危險，在(zai)測(ce)試(shi)(shi)后就必須給(gei)該被(bei)測(ce)物(DUT)放電(dian)(dian)(dian)。DC測(ce)試(shi)(shi)會對電(dian)(dian)(dian)容充電(dian)(dian)(dian)。如果DUT實(shi)際(ji)(ji)上用交流電(dian)(dian)(dian)源的話，DC法就沒(mei)有模擬實(shi)際(ji)(ji)情況。

Q:AC耐壓(ya)測(ce)(ce)試(shi)和DC耐壓(ya)測(ce)(ce)試(shi)的區別

A:耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)有兩(liang)種(zhong)(zhong)：AC耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)和DC耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)。由于絕緣材料(liao)(liao)的(de)(de)(de)(de)特性決(jue)定了(le)交(jiao)(jiao)流(liu)和直(zhi)(zhi)流(liu)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)的(de)(de)(de)(de)擊(ji)(ji)穿(chuan)機理不(bu)同(tong)。大多(duo)數(shu)(shu)絕緣材料(liao)(liao)和系統(tong)都(dou)包含了(le)一(yi)系列不(bu)同(tong)的(de)(de)(de)(de)介質。當對之施加交(jiao)(jiao)流(liu)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)時(shi)(shi)，電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)將按材料(liao)(liao)的(de)(de)(de)(de)介電(dian)(dian)(dian)(dian)(dian)(dian)常(chang)數(shu)(shu)和尺寸等參數(shu)(shu)的(de)(de)(de)(de)比(bi)(bi)(bi)例(li)來分(fen)配(pei)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。而(er)(er)直(zhi)(zhi)流(liu)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)只按材料(liao)(liao)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)阻的(de)(de)(de)(de)比(bi)(bi)(bi)例(li)來分(fen)配(pei)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。而(er)(er)且實(shi)際上，絕緣結構發生(sheng)擊(ji)(ji)穿(chuan)，往往是(shi)電(dian)(dian)(dian)(dian)(dian)(dian)擊(ji)(ji)穿(chuan)，熱(re)擊(ji)(ji)穿(chuan)，放電(dian)(dian)(dian)(dian)(dian)(dian)等多(duo)種(zhong)(zhong)形式(shi)同(tong)時(shi)(shi)存在，很難截然分(fen)開。而(er)(er)交(jiao)(jiao)流(liu)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)比(bi)(bi)(bi)直(zhi)(zhi)流(liu)電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)增加了(le)熱(re)擊(ji)(ji)穿(chuan)的(de)(de)(de)(de)可能性。所以，我們(men)認為交(jiao)(jiao)流(liu)耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)比(bi)(bi)(bi)直(zhi)(zhi)流(liu)耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)更加嚴(yan)格(ge)。實(shi)際操作中，在進(jin)行耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)時(shi)(shi)，如果(guo)要使用直(zhi)(zhi)流(liu)做耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)時(shi)(shi)，試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)要求比(bi)(bi)(bi)交(jiao)(jiao)流(liu)工(gong)頻的(de)(de)(de)(de)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)高。一(yi)般直(zhi)(zhi)流(liu)耐(nai)(nai)壓(ya)(ya)(ya)測(ce)(ce)試(shi)(shi)(shi)(shi)的(de)(de)(de)(de)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)是(shi)通過(guo)把交(jiao)(jiao)流(liu)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)的(de)(de)(de)(de)有效(xiao)值乘(cheng)以一(yi)個常(chang)數(shu)(shu)K。通過(guo)對比(bi)(bi)(bi)測(ce)(ce)試(shi)(shi)(shi)(shi)，我們(men)有如下的(de)(de)(de)(de)結果(guo)：電(dian)(dian)(dian)(dian)(dian)(dian)線電(dian)(dian)(dian)(dian)(dian)(dian)纜產(chan)品，常(chang)數(shu)(shu)K選用3; 航(hang)空工(gong)業，常(chang)數(shu)(shu)K選用1.6 至1.7;CSA對民用產(chan)品一(yi)般使用1.414。

Q:怎(zen)樣(yang)確定(ding)耐壓(ya)測(ce)試使(shi)用的(de)測(ce)試電壓(ya)呢?

A:決(jue)定耐壓(ya)測(ce)試(shi)的(de)(de)測(ce)試(shi)電(dian)壓(ya)取決(jue)于(yu)(yu)您產(chan)品所要(yao)投(tou)入的(de)(de)市場，你必(bi)須遵守該國(guo)進(jin)口(kou)管(guan)制條例組成部分(fen)的(de)(de)安全標準或規定。安全標準中規定了耐壓(ya)測(ce)試(shi)的(de)(de)測(ce)試(shi)電(dian)壓(ya)和測(ce)試(shi)時(shi)間(jian)。理想的(de)(de)狀(zhuang)況是(shi)請你的(de)(de)客戶給您相關測(ce)試(shi)要(yao)求。一般耐壓(ya)測(ce)試(shi)的(de)(de)測(ce)試(shi)電(dian)壓(ya)如(ru)下：工(gong)(gong)作(zuo)(zuo)電(dian)壓(ya)在42V到1000V之(zhi)間(jian)的(de)(de)，測(ce)試(shi)電(dian)壓(ya)是(shi)工(gong)(gong)作(zuo)(zuo)電(dian)壓(ya)的(de)(de)兩(liang)倍加(jia)上1000V。這種測(ce)試(shi)電(dian)壓(ya)要(yao)施加(jia)1分(fen)鐘。例如(ru)，對于(yu)(yu)工(gong)(gong)作(zuo)(zuo)于(yu)(yu)230V的(de)(de)一種產(chan)品，測(ce)試(shi)電(dian)壓(ya)是(shi)1460V。如(ru)果(guo)減短施加(jia)電(dian)壓(ya)的(de)(de)時(shi)間(jian)，就必(bi)須增大(da)測(ce)試(shi)電(dian)壓(ya)。

Q:什么是(shi)耐壓測試的容(rong)量，要如何計(ji)算(suan)?

A:耐(nai)壓(ya)測(ce)試(shi)器的容(rong)量(liang)是指(zhi)其(qi)功率輸(shu)(shu)出。而(er)耐(nai)壓(ya)測(ce)試(shi)器容(rong)量(liang)決定于大(da)的輸(shu)(shu)出電流x大(da)輸(shu)(shu)出電壓(ya)。例如：5000Vx100mA=500VA

Q:為什么使用AC耐(nai)壓測試與DC耐(nai)壓測試所(suo)量測之漏電流值會不同(tong)?

A:被測(ce)(ce)(ce)(ce)(ce)(ce)物(wu)(wu)(wu)的(de)(de)雜散電(dian)(dian)(dian)(dian)(dian)容(rong)是導致AC與(yu)DC耐(nai)壓測(ce)(ce)(ce)(ce)(ce)(ce)試所(suo)量測(ce)(ce)(ce)(ce)(ce)(ce)值不(bu)同的(de)(de)主要原因(yin)。用(yong)AC測(ce)(ce)(ce)(ce)(ce)(ce)試時可能無(wu)法充飽這些(xie)雜散電(dian)(dian)(dian)(dian)(dian)容(rong)，會有(you)(you)一個持續電(dian)(dian)(dian)(dian)(dian)流(liu)流(liu)過這些(xie)雜散電(dian)(dian)(dian)(dian)(dian)容(rong)。而用(yong)DC測(ce)(ce)(ce)(ce)(ce)(ce)試，一旦被測(ce)(ce)(ce)(ce)(ce)(ce)物(wu)(wu)(wu)上的(de)(de)雜散電(dian)(dian)(dian)(dian)(dian)容(rong)被充飽，剩下的(de)(de)就是被測(ce)(ce)(ce)(ce)(ce)(ce)物(wu)(wu)(wu)實際的(de)(de)漏電(dian)(dian)(dian)(dian)(dian)電(dian)(dian)(dian)(dian)(dian)流(liu)，故使(shi)用(yong)AC耐(nai)壓測(ce)(ce)(ce)(ce)(ce)(ce)試與(yu)DC耐(nai)壓測(ce)(ce)(ce)(ce)(ce)(ce)試所(suo)量測(ce)(ce)(ce)(ce)(ce)(ce)之漏電(dian)(dian)(dian)(dian)(dian)流(liu)值會有(you)(you)不(bu)同 。

Q:什(shen)么是耐壓測試之漏(lou)電流(liu)

A:絕(jue)(jue)緣(yuan)體(ti)是(shi)不導(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)的(de)(de)(de)(de)，但實際(ji)上幾(ji)乎沒有(you)(you)什么一種絕(jue)(jue)緣(yuan)材料(liao)是(shi)不導(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)的(de)(de)(de)(de)。任(ren)何一種絕(jue)(jue)緣(yuan)材料(liao)，在其兩端(duan)施(shi)加電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓，總會有(you)(you)一定電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)通過(guo)(guo)，這種電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)的(de)(de)(de)(de)有(you)(you)功分(fen)量叫做泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)，而這種現象(xiang)也(ye)叫做絕(jue)(jue)緣(yuan)體(ti)的(de)(de)(de)(de)泄(xie)漏(lou)(lou)(lou)(lou)。 對(dui)于電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器的(de)(de)(de)(de)測試，泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)是(shi)指在沒有(you)(you)故(gu)障施(shi)加電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)壓的(de)(de)(de)(de)情(qing)況下，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)氣中(zhong)帶相互絕(jue)(jue)緣(yuan)的(de)(de)(de)(de)金屬(shu)零件之(zhi)間，或(huo)帶電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)零件與(yu)接地零件之(zhi)間，通過(guo)(guo)其周圍介質或(huo)絕(jue)(jue)緣(yuan)表面所形成的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)稱(cheng)為(wei)泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)。按照(zhao)美國UL標準，泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)是(shi)包括電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)容(rong)耦合電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)在內(nei)的(de)(de)(de)(de)，能(neng)從家用電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)器可(ke)觸(chu)及部分(fen)傳(chuan)導(dao)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)。泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)包括兩部分(fen)，一部分(fen)是(shi)通過(guo)(guo)絕(jue)(jue)緣(yuan)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)阻的(de)(de)(de)(de)傳(chuan)導(dao)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)I1;另一部分(fen)是(shi)通過(guo)(guo)分(fen)布(bu)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)容(rong)的(de)(de)(de)(de)位移電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)I2，后者容(rong)抗(kang)為(wei)XC=1/2pfc與(yu)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)源頻率(lv)成反比，分(fen)布(bu)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)容(rong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)隨頻率(lv)升高而增(zeng)(zeng)加，所以泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)隨電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)源頻率(lv)升高而增(zeng)(zeng)加。例如：用可(ke)控硅供電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)，其諧(xie)波分(fen)量使泄(xie)漏(lou)(lou)(lou)(lou)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)增(zeng)(zeng)大(da)。

Q:耐壓測試(shi)之漏電(dian)(dian)流與電(dian)(dian)源(yuan)泄漏電(dian)(dian)流(接(jie)觸電(dian)(dian)流)有何不同?

A:耐(nai)壓(ya)測(ce)試(shi)是偵測(ce)流(liu)(liu)(liu)過被(bei)測(ce)物絕緣系統之漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)，以一高(gao)于工(gong)作(zuo)電(dian)(dian)(dian)(dian)壓(ya)之電(dian)(dian)(dian)(dian)壓(ya)施加(jia)于絕緣系統;而(er)電(dian)(dian)(dian)(dian)源泄(xie)漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(接觸電(dian)(dian)(dian)(dian)流(liu)(liu)(liu))則是在被(bei)測(ce)物正常操(cao)作(zuo)下(xia)，以一不利的條(tiao)件(電(dian)(dian)(dian)(dian)壓(ya)、頻率(lv))對被(bei)測(ce)物量(liang)(liang)測(ce)漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)。簡單地說，耐(nai)壓(ya)測(ce)試(shi)之漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)為無(wu)工(gong)作(zuo)電(dian)(dian)(dian)(dian)源下(xia)所量(liang)(liang)測(ce)之漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)，電(dian)(dian)(dian)(dian)源泄(xie)漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(接觸電(dian)(dian)(dian)(dian)流(liu)(liu)(liu))為正常操(cao)作(zuo)下(xia)所量(liang)(liang)測(ce)之漏(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)(liu) 。

Q:接(jie)觸電流(liu)的(de)分類

A:對于(yu)不(bu)同結構(gou)的電(dian)(dian)子產品，接觸(chu)電(dian)(dian)流(liu)的量(liang)測也(ye)是有不(bu)同的要求，但總括來說接觸(chu)電(dian)(dian)流(liu)可分為(wei)對地接觸(chu)電(dian)(dian)流(liu)Ground Leakage Current、表(biao)面(mian)對地接觸(chu)電(dian)(dian)流(liu)Surface to Line Leakage Current以(yi)及表(biao)面(mian)間接觸(chu)電(dian)(dian)流(liu)Surface to Surface Leakage Current測試三種。

Q:為(wei)什么(me)要做接觸電流測試?

A:對于 I 類設備(bei)的(de)(de)電(dian)(dian)子(zi)產(chan)品可觸及的(de)(de)金(jin)屬(shu)部件或是(shi)(shi)外殼還應具備(bei)良好的(de)(de)接地線路，以作(zuo)為(wei)基本絕(jue)緣以外的(de)(de)一種(zhong)防電(dian)(dian)擊保護(hu)措施。但是(shi)(shi)[size=+0]我們也經常遇到一些使(shi)用(yong)者隨意(yi)將(jiang) I 類設備(bei)當(dang)成 II 類設備(bei)使(shi)用(yong)，或是(shi)(shi)說其(qi) I 類設備(bei)電(dian)(dian)源(yuan)輸入(ru)端直接將(jiang)接地端 (GND) 拔(ba)除(chu)，這(zhe)樣就(jiu)存在一定的(de)(de)安全隱(yin)患。即(ji)便如此，作(zuo)為(wei)生產(chan)廠商有義務去(qu)避免這(zhe)種(zhong)情(qing)況對使(shi)用(yong)者造成的(de)(de)危險(xian)。這(zhe)就(jiu)是(shi)(shi)為(wei)什么要做接觸電(dian)(dian)流(liu)測試(shi)的(de)(de)目的(de)(de)所在。

Q:為什么耐壓測試之漏(lou)電電流設定無一標準?

A:在AC耐(nai)壓測試(shi)時因被測物種類(lei)不同(tong)，且被測物內(nei)都會有雜散電(dian)容(rong)存在以及(ji)測試(shi)電(dian)壓不同(tong)就會有不同(tong)的(de)漏電(dian)電(dian)流故無一標(biao)準。

Q:如何決定測(ce)試電壓?

A:決(jue)定測(ce)試電(dian)壓(ya)方法就是依(yi)(yi)據測(ce)試所需之規(gui)格設(she)定。一般(ban)而言，我(wo)們(men)會依(yi)(yi)2倍的(de)(de)(de)工(gong)作電(dian)壓(ya)加上1000V作為測(ce)試電(dian)壓(ya)設(she)定。例如一產品的(de)(de)(de)工(gong)作電(dian)壓(ya)是115VAC的(de)(de)(de)話，我(wo)們(men)就以(yi)2 x 115 + 1000 = 1230 Volt作為測(ce)試電(dian)壓(ya)。當然，測(ce)試電(dian)壓(ya)也(ye)會因絕緣層的(de)(de)(de)等(deng)級(ji)之不同(tong)而有不同(tong)的(de)(de)(de)設(she)定。

Q:絕緣阻抗(IR)測試是(shi)什(shen)么(me)?

A:絕緣(yuan)電阻測(ce)試(shi)和耐(nai)(nai)壓測(ce)試(shi)非常相似。把高達(da)1000V的(de)DC電壓施加(jia)到需要(yao)測(ce)試(shi)的(de)兩(liang)點。IR測(ce)試(shi)給出的(de)通(tong)常是(shi)以(yi)兆(zhao)歐為(wei)單位(wei)的(de)電阻值(zhi)，而不是(shi)耐(nai)(nai)壓測(ce)試(shi)得(de)出的(de)Pass / Fail表示。一(yi)般典型的(de)是(shi)，測(ce)試(shi)電壓為(wei)500V 直流(liu)，絕緣(yuan)電阻(IR)的(de)值(zhi)不得(de)低(di)于幾兆(zhao)歐。絕緣(yuan)阻抗(kang)測(ce)試(shi)為(wei)非破壞試(shi)驗，且能偵測(ce)絕緣(yuan)是(shi)否良好，在某些規范中(zhong)，是(shi)先做絕緣(yuan)阻抗(kang)測(ce)試(shi)再(zai)進行(xing)耐(nai)(nai)壓測(ce)試(shi)，而絕緣(yuan)阻抗(kang)測(ce)試(shi)無法通(tong)過(guo)時，往往耐(nai)(nai)壓測(ce)試(shi)也無法通(tong)過(guo)。

Q:接地阻抗(Ground Bond)測試(shi)是什么?

A:接(jie)(jie)地(di)(di)(di)連接(jie)(jie)測(ce)試，有人(ren)稱之為接(jie)(jie)地(di)(di)(di)連續(xu)性(Ground Continuity)測(ce)試，測(ce)量(liang)在DUT的(de)機架與接(jie)(jie)地(di)(di)(di)柱之間的(de)阻抗(kang)。接(jie)(jie)地(di)(di)(di)連接(jie)(jie)測(ce)試確定，該產品要(yao)是壞了(le)的(de)話(hua)DUT的(de)保護電(dian)路是否能夠(gou)勝任地(di)(di)(di)處理故障(zhang)電(dian)流(liu)。接(jie)(jie)地(di)(di)(di)連接(jie)(jie)測(ce)試器將產生(sheng)通過接(jie)(jie)地(di)(di)(di)電(dian)路的(de)，大達到30A的(de)DC電(dian)流(liu)或AC 均方根值電(dian)流(liu)(CSA要(yao)求量(liang)測(ce)40A)，從而確定接(jie)(jie)地(di)(di)(di)電(dian)路的(de)阻抗(kang)，其(qi)一(yi)般在0.1奧姆以下。

Q:耐壓測(ce)試(shi)與絕緣電阻測(ce)試(shi)之(zhi)間有(you)什么不同(tong)呢(ni)?

A:IR測(ce)(ce)(ce)試(shi)是(shi)一種(zhong)定性測(ce)(ce)(ce)試(shi)，它給出絕緣系統的(de)相(xiang)對質量(liang)的(de)一個(ge)表示。通(tong)常(chang)用(yong)500V或(huo)(huo)1000V的(de)DC 電(dian)壓(ya)進(jin)行(xing)測(ce)(ce)(ce)試(shi)，結果用(yong)兆歐電(dian)阻來量(liang)測(ce)(ce)(ce)。耐壓(ya)測(ce)(ce)(ce)試(shi)也給被(bei)測(ce)(ce)(ce)物(DUT)施加高壓(ya)，但(dan)所加電(dian)壓(ya)比IR 測(ce)(ce)(ce)試(shi)的(de)高。其可以在AC或(huo)(huo)DC電(dian)壓(ya)下進(jin)行(xing)。結  果用(yong)毫安培(pei)或(huo)(huo)微安來量(liang)測(ce)(ce)(ce)。在有些規格中(zhong)，先進(jin)行(xing)IR測(ce)(ce)(ce)試(shi)，接(jie)著再進(jin)行(xing)耐壓(ya)測(ce)(ce)(ce)試(shi)。如果一個(ge)被(bei)測(ce)(ce)(ce)物(DUT)無(wu)法(fa)通(tong)過IR測(ce)(ce)(ce)試(shi)，則(ze)此被(bei)測(ce)(ce)(ce)物(DUT)也無(wu)法(fa)通(tong)過在更高的(de)電(dian)壓(ya)下進(jin)行(xing)的(de)耐壓(ya)測(ce)(ce)(ce)試(shi)。

Q:為何接地阻抗測試要有開路電壓限(xian)制? 為何建議使用交流(AC)電流?

A:接(jie)地(di)阻抗測試(shi)(shi)的(de)(de)目的(de)(de)是要(yao)確保當設備產(chan)品發(fa)生(sheng)異常狀(zhuang)況時，保護接(jie)地(di)線可(ke)允許承受故障電(dian)(dian)流(liu)流(liu)過(guo)(guo)以(yi)(yi)(yi)確保使(shi)用者的(de)(de)安全。安規(gui)標準測試(shi)(shi)電(dian)(dian)壓(ya)要(yao)求開路(lu)電(dian)(dian)壓(ya)大值不(bu)可(ke)以(yi)(yi)(yi)超過(guo)(guo) 12V 的(de)(de)限制(zhi)，即是基于使(shi)用者的(de)(de)安全考慮(lv)，一旦被測物發(fa)生(sheng)測試(shi)(shi)故障時，可(ke)以(yi)(yi)(yi)減(jian)低操(cao)作人員遭受電(dian)(dian)擊的(de)(de)危險(xian)。而一般標準要(yao)求接(jie)地(di)電(dian)(dian)阻要(yao)小于 0.1ohm，建(jian)議采以(yi)(yi)(yi)頻(pin)率可(ke)以(yi)(yi)(yi)選(xuan)擇 50Hz或 60Hz 的(de)(de)交(jiao)流(liu)電(dian)(dian)流(liu)測試(shi)(shi) ，以(yi)(yi)(yi)符(fu)合產(chan)品實際的(de)(de)工作環境。

Q:耐壓測試與(yu)電(dian)源泄漏(lou)測試測出的(de)泄漏(lou)電(dian)流兩(liang)者有什么不同(tong)呢?

A:耐壓測試(shi)與電(dian)源泄(xie)漏(lou)(lou)測試(shi)之(zhi)間是有一(yi)些差(cha)異，但一(yi)般(ban)而言, 這些差(cha)別(bie)可被(bei)概(gai)括如下。耐壓測試(shi)是利用(yong)高(gao)電(dian)壓對產(chan)(chan)品的(de)(de)絕緣(yuan)加壓以確定是否(fou)產(chan)(chan)品的(de)(de)絕緣(yuan)強度足夠防止過量的(de)(de)泄(xie)漏(lou)(lou)電(dian)流(liu)(liu)。 泄(xie)漏(lou)(lou)電(dian)流(liu)(liu)測試(shi)是量測產(chan)(chan)品在(zai)使用(yong)下，在(zai)正常(chang)和電(dian)源單一(yi)故障狀態下所流(liu)(liu)經(jing)產(chan)(chan)品的(de)(de)泄(xie)漏(lou)(lou)電(dian)流(liu)(liu)量。

Q:在直流耐壓測(ce)試時，如何斷定電(dian)容性負載(zai)的(de)放電(dian)時間?

A:放電(dian)時間之(zhi)不同是視被測試物之(zhi)電(dian)容量(liang)以及(ji)耐壓(ya)測試機(ji)之(zhi)放電(dian)電(dian)路(lu)而定。電(dian)容量(liang)越(yue)大(da)所需的(de)放電(dian)時間越(yue)長.

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