Q:什(shen)么叫耐壓測試?

A:耐壓測試(shi)(shi)或高壓測試(shi)(shi)(HIPOT測試(shi)(shi)) ，是用來驗證(zheng)產(chan)品的(de)(de)(de)質量和電(dian)氣安全特性(xing)(xing)(如JSI、CSA、BSI、UL、IEC、TUV等等國(guo)際(ji)安全機構所要求(qiu)的(de)(de)(de)標準)的(de)(de)(de)一種{bfb}的(de)(de)(de)生產(chan)線測試(shi)(shi)。HIPOT測試(shi)(shi)是確(que)定電(dian)子絕(jue)緣材料足以抵抗瞬間高電(dian)壓的(de)(de)(de)一個非(fei)破壞性(xing)(xing)的(de)(de)(de)測試(shi)(shi)，是適用于所有設(she)備為保(bao)證(zheng)絕(jue)緣材料是足夠的(de)(de)(de)的(de)(de)(de)一個高壓測試(shi)(shi)。進(jin)行HIPOT測試(shi)(shi)的(de)(de)(de)其它原因是，它可以查(cha)出可能的(de)(de)(de)瑕疵譬(pi)如在制造(zao)(zao)過程期間造(zao)(zao)成(cheng)的(de)(de)(de)漏(lou)電(dian)距離和電(dian)氣間隙不夠。

Q:為何要做耐壓測試?

A:正常(chang)情況(kuang)下(xia)，電(dian)(dian)(dian)(dian)(dian)力(li)(li)系(xi)(xi)統(tong)中的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)波(bo)形是(shi)正弦波(bo)。電(dian)(dian)(dian)(dian)(dian)力(li)(li)系(xi)(xi)統(tong)在(zai)運(yun)行中由于雷(lei)(lei)擊(ji)、操作、故障或(huo)電(dian)(dian)(dian)(dian)(dian)氣設(she)備(bei)的(de)(de)(de)(de)參(can)數配合(he)不當等原因，引起系(xi)(xi)統(tong)中某些部(bu)分(fen)(fen)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)突然升高(gao)，大大超過(guo)(guo)(guo)其額(e)定(ding)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，這(zhe)就(jiu)是(shi)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)按其發(fa)生的(de)(de)(de)(de)原因可分(fen)(fen)為兩大類，一(yi)類是(shi)由于直接(jie)雷(lei)(lei)擊(ji)或(huo)雷(lei)(lei)電(dian)(dian)(dian)(dian)(dian)感應(ying)而引起的(de)(de)(de)(de)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，稱為外部(bu)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。雷(lei)(lei)電(dian)(dian)(dian)(dian)(dian)沖擊(ji)電(dian)(dian)(dian)(dian)(dian)流和沖擊(ji)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)的(de)(de)(de)(de)幅(fu)值都很(hen)大，而且持續時間很(hen)短，破壞性極大。但由于城鎮(zhen)及一(yi)般工(gong)業企業內(nei)的(de)(de)(de)(de)3-10kV與以下(xia)的(de)(de)(de)(de)架空(kong)線路(lu)，因受廠房或(huo)高(gao)大建(jian)筑物的(de)(de)(de)(de)屏蔽保護，所(suo)以遭受直接(jie)雷(lei)(lei)擊(ji)的(de)(de)(de)(de)概(gai)率很(hen)小(xiao)，比較(jiao)安全。而且這(zhe)里討(tao)論的(de)(de)(de)(de)是(shi)民(min)用(yong)電(dian)(dian)(dian)(dian)(dian)器，不在(zai)上述范(fan)圍內(nei)，就(jiu)不進一(yi)步(bu)討(tao)論。另一(yi)類是(shi)因為電(dian)(dian)(dian)(dian)(dian)力(li)(li)系(xi)(xi)統(tong)內(nei)部(bu)的(de)(de)(de)(de)能量轉(zhuan)換(huan)或(huo)參(can)數變化引起的(de)(de)(de)(de)，例如切(qie)合(he)空(kong)載線路(lu)，切(qie)斷空(kong)載變壓(ya)(ya)(ya)器，系(xi)(xi)統(tong)內(nei)發(fa)生單相弧光接(jie)地等，稱為內(nei)部(bu)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。內(nei)部(bu)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)是(shi)確(que)定(ding)電(dian)(dian)(dian)(dian)(dian)力(li)(li)系(xi)(xi)統(tong)中各種電(dian)(dian)(dian)(dian)(dian)氣設(she)備(bei)正常(chang)絕(jue)緣水平的(de)(de)(de)(de)主要依據。也就(jiu)是(shi)說，產品的(de)(de)(de)(de)絕(jue)緣結構(gou)的(de)(de)(de)(de)設(she)計不但要考慮(lv)(lv)額(e)定(ding)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)而且要考慮(lv)(lv)產品使用(yong)環境的(de)(de)(de)(de)內(nei)部(bu)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。耐壓(ya)(ya)(ya)測(ce)試(shi)就(jiu)是(shi)檢測(ce)產品絕(jue)緣結構(gou)是(shi)否能夠承(cheng)受電(dian)(dian)(dian)(dian)(dian)力(li)(li)系(xi)(xi)統(tong)的(de)(de)(de)(de)內(nei)部(bu)過(guo)(guo)(guo)電(dian)(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。

Q:AC耐壓(ya)測試有什么(me)優點呢?

A:通常AC 耐(nai)壓(ya)(ya)測(ce)試比DC耐(nai)壓(ya)(ya)測(ce)試更容易獲得安全(quan)機構的(de)接受(shou)。主要(yao)理由是大多數(shu)被測(ce)物(wu)品將工(gong)作(zuo)于(yu)(yu)AC電(dian)(dian)壓(ya)(ya)之(zhi)下，而且AC耐(nai)壓(ya)(ya)測(ce)試更接近(jin)產(chan)品在(zai)(zai)實際使用(yong)中會碰到的(de)壓(ya)(ya)力。由于(yu)(yu)AC測(ce)試不(bu)(bu)會給(gei)(gei)容性負(fu)載充電(dian)(dian)，從開(kai)始施(shi)加電(dian)(dian)壓(ya)(ya)到測(ce)試結(jie)束(shu)電(dian)(dian)流(liu)(liu)讀數(shu)保持一致(zhi)。因此，由于(yu)(yu)不(bu)(bu)存在(zai)(zai)監視電(dian)(dian)流(liu)(liu)讀數(shu)所要(yao)求的(de)穩定化(hua)問題，也就不(bu)(bu)需要(yao)逐漸升高電(dian)(dian)壓(ya)(ya)。這(zhe)意味著(zhu)，除非被測(ce)產(chan)品感應到突然施(shi)加的(de)電(dian)(dian)壓(ya)(ya)，操作(zuo)員可以(yi)立即施(shi)加全(quan)電(dian)(dian)壓(ya)(ya)并讀出電(dian)(dian)流(liu)(liu)而不(bu)(bu)用(yong)等待。由于(yu)(yu)AC電(dian)(dian)壓(ya)(ya)不(bu)(bu)會給(gei)(gei)負(fu)載充電(dian)(dian)，在(zai)(zai)測(ce)試之(zhi)后用(yong)不(bu)(bu)著(zhu)給(gei)(gei)被測(ce)設備(bei)放電(dian)(dian)。

Q:AC耐壓(ya)測試有什么缺點呢(ni)?

A:在(zai)測(ce)試容(rong)性(xing)(xing)負載時，總電(dian)(dian)流(liu)(liu)(liu)(liu)由(you)(you)電(dian)(dian)抗性(xing)(xing)電(dian)(dian)流(liu)(liu)(liu)(liu)和泄(xie)漏(lou)電(dian)(dian)流(liu)(liu)(liu)(liu)組成。當電(dian)(dian)抗性(xing)(xing)電(dian)(dian)流(liu)(liu)(liu)(liu)量遠(yuan)(yuan)大(da)于(yu)真實泄(xie)漏(lou)電(dian)(dian)流(liu)(liu)(liu)(liu)時，可能(neng)難(nan)于(yu)測(ce)出有(you)過量泄(xie)漏(lou)電(dian)(dian)流(liu)(liu)(liu)(liu)的(de)產品。在(zai)測(ce)試大(da)容(rong)性(xing)(xing)負載時，所需要的(de)總電(dian)(dian)流(liu)(liu)(liu)(liu)遠(yuan)(yuan)大(da)于(yu)泄(xie)漏(lou)電(dian)(dian)流(liu)(liu)(liu)(liu)本身(shen)。由(you)(you)于(yu)操作員(yuan)面(mian)對更(geng)大(da)的(de)電(dian)(dian)流(liu)(liu)(liu)(liu)，這可能(neng)是一個更(geng)大(da)的(de)危險。

Q:DC耐壓測試有什么優點呢?

A:當被測(ce)設(she)備(DUT)充(chong)滿了電(dian)(dian)，流(liu)(liu)(liu)過的就只有真正的泄(xie)漏電(dian)(dian)流(liu)(liu)(liu)。這(zhe)使DC耐壓(ya)(ya)測(ce)試(shi)器能夠清楚地顯示出被測(ce)產品的真正泄(xie)漏電(dian)(dian)流(liu)(liu)(liu)。由(you)于充(chong)電(dian)(dian)電(dian)(dian)流(liu)(liu)(liu)是短(duan)暫的，DC耐壓(ya)(ya)測(ce)試(shi)器的功率要(yao)求通常可以比用來測(ce)試(shi)同樣產品的AC耐壓(ya)(ya)測(ce)試(shi)器的功率要(yao)求小得多。

Q:DC耐(nai)壓測試儀有什么缺點呢?

A:由于DC耐壓測(ce)(ce)試(shi)(shi)的確給被測(ce)(ce)物(DUT)充電(dian)，為了(le)xx在耐壓測(ce)(ce)試(shi)(shi)后處置被測(ce)(ce)物(DUT) 之操作員(yuan)觸電(dian)的危險，在測(ce)(ce)試(shi)(shi)后就必須(xu)給該被測(ce)(ce)物(DUT)放(fang)電(dian)。DC測(ce)(ce)試(shi)(shi)會對電(dian)容(rong)充電(dian)。如果DUT實際(ji)上用交(jiao)流(liu)電(dian)源(yuan)的話，DC法就沒有模擬實際(ji)情況(kuang)。

Q:AC耐壓(ya)測(ce)試和DC耐壓(ya)測(ce)試的區別

A:耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)有(you)兩種(zhong)：AC耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)和DC耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)。由(you)于絕(jue)緣(yuan)材(cai)(cai)料的(de)(de)(de)特性(xing)決定了交流和直(zhi)(zhi)流電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)的(de)(de)(de)擊(ji)穿(chuan)機理不(bu)(bu)同。大多(duo)數(shu)(shu)絕(jue)緣(yuan)材(cai)(cai)料和系統都(dou)包含了一(yi)系列不(bu)(bu)同的(de)(de)(de)介(jie)質。當(dang)對之施加(jia)(jia)交流試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)時(shi)，電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)將按材(cai)(cai)料的(de)(de)(de)介(jie)電(dian)(dian)(dian)常(chang)(chang)(chang)數(shu)(shu)和尺(chi)寸等(deng)參(can)數(shu)(shu)的(de)(de)(de)比例來(lai)分(fen)配(pei)電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)。而(er)直(zhi)(zhi)流電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)只按材(cai)(cai)料的(de)(de)(de)電(dian)(dian)(dian)阻的(de)(de)(de)比例來(lai)分(fen)配(pei)電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)。而(er)且(qie)實(shi)際上(shang)，絕(jue)緣(yuan)結(jie)構(gou)發生(sheng)擊(ji)穿(chuan)，往往是電(dian)(dian)(dian)擊(ji)穿(chuan)，熱擊(ji)穿(chuan)，放電(dian)(dian)(dian)等(deng)多(duo)種(zhong)形式同時(shi)存在(zai)，很難截(jie)然分(fen)開。而(er)交流電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)比直(zhi)(zhi)流電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)增(zeng)加(jia)(jia)了熱擊(ji)穿(chuan)的(de)(de)(de)可能性(xing)。所以，我們認(ren)為交流耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)比直(zhi)(zhi)流耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)更加(jia)(jia)嚴格。實(shi)際操作中，在(zai)進行耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)時(shi)，如(ru)果要使(shi)用(yong)直(zhi)(zhi)流做耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)時(shi)，試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)要求比交流工頻的(de)(de)(de)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)高。一(yi)般直(zhi)(zhi)流耐壓(ya)(ya)(ya)(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)的(de)(de)(de)試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)是通過把交流試(shi)(shi)(shi)(shi)驗電(dian)(dian)(dian)壓(ya)(ya)(ya)(ya)(ya)(ya)的(de)(de)(de)有(you)效(xiao)值(zhi)乘以一(yi)個常(chang)(chang)(chang)數(shu)(shu)K。通過對比測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，我們有(you)如(ru)下的(de)(de)(de)結(jie)果：電(dian)(dian)(dian)線電(dian)(dian)(dian)纜(lan)產(chan)品，常(chang)(chang)(chang)數(shu)(shu)K選用(yong)3; 航空工業(ye)，常(chang)(chang)(chang)數(shu)(shu)K選用(yong)1.6 至1.7;CSA對民(min)用(yong)產(chan)品一(yi)般使(shi)用(yong)1.414。

Q:怎樣確定耐壓測試(shi)使用的測試(shi)電(dian)壓呢?

A:決(jue)定耐壓(ya)(ya)測(ce)(ce)(ce)試(shi)的(de)測(ce)(ce)(ce)試(shi)電壓(ya)(ya)取決(jue)于您(nin)(nin)產(chan)品所(suo)要(yao)投(tou)入(ru)的(de)市場，你必(bi)須遵(zun)守該(gai)國進(jin)口管制條例(li)組(zu)成(cheng)部(bu)分(fen)(fen)的(de)安全(quan)標準或規(gui)定。安全(quan)標準中(zhong)規(gui)定了耐壓(ya)(ya)測(ce)(ce)(ce)試(shi)的(de)測(ce)(ce)(ce)試(shi)電壓(ya)(ya)和測(ce)(ce)(ce)試(shi)時間(jian)。理想的(de)狀況是(shi)(shi)請你的(de)客戶給(gei)您(nin)(nin)相關測(ce)(ce)(ce)試(shi)要(yao)求(qiu)。一般耐壓(ya)(ya)測(ce)(ce)(ce)試(shi)的(de)測(ce)(ce)(ce)試(shi)電壓(ya)(ya)如下(xia)：工(gong)作(zuo)電壓(ya)(ya)在(zai)42V到(dao)1000V之(zhi)間(jian)的(de)，測(ce)(ce)(ce)試(shi)電壓(ya)(ya)是(shi)(shi)工(gong)作(zuo)電壓(ya)(ya)的(de)兩倍加上1000V。這種測(ce)(ce)(ce)試(shi)電壓(ya)(ya)要(yao)施(shi)加1分(fen)(fen)鐘。例(li)如，對(dui)于工(gong)作(zuo)于230V的(de)一種產(chan)品，測(ce)(ce)(ce)試(shi)電壓(ya)(ya)是(shi)(shi)1460V。如果減短施(shi)加電壓(ya)(ya)的(de)時間(jian)，就必(bi)須增大測(ce)(ce)(ce)試(shi)電壓(ya)(ya)。

Q:什么是耐壓測試的容量，要如何(he)計算?

A:耐壓(ya)測試(shi)器的(de)容(rong)量是指(zhi)其(qi)功(gong)率輸出。而耐壓(ya)測試(shi)器容(rong)量決定于大的(de)輸出電(dian)流x大輸出電(dian)壓(ya)。例如：5000Vx100mA=500VA

Q:為什么(me)使用(yong)AC耐(nai)壓測(ce)(ce)試與DC耐(nai)壓測(ce)(ce)試所量測(ce)(ce)之漏電流值會不(bu)同?

A:被(bei)測(ce)(ce)物的(de)雜(za)散電(dian)容(rong)(rong)是(shi)導致AC與DC耐壓(ya)測(ce)(ce)試(shi)所量測(ce)(ce)值(zhi)不(bu)(bu)同(tong)的(de)主要原因。用(yong)AC測(ce)(ce)試(shi)時可能(neng)無法充(chong)飽(bao)這(zhe)些雜(za)散電(dian)容(rong)(rong)，會有一個持(chi)續電(dian)流流過這(zhe)些雜(za)散電(dian)容(rong)(rong)。而用(yong)DC測(ce)(ce)試(shi)，一旦被(bei)測(ce)(ce)物上(shang)的(de)雜(za)散電(dian)容(rong)(rong)被(bei)充(chong)飽(bao)，剩下(xia)的(de)就(jiu)是(shi)被(bei)測(ce)(ce)物實際的(de)漏電(dian)電(dian)流，故使(shi)用(yong)AC耐壓(ya)測(ce)(ce)試(shi)與DC耐壓(ya)測(ce)(ce)試(shi)所量測(ce)(ce)之漏電(dian)流值(zhi)會有不(bu)(bu)同(tong) 。

Q:什么是耐(nai)壓測試之漏電流(liu)

A:絕(jue)緣(yuan)(yuan)體(ti)是(shi)不導(dao)電(dian)(dian)(dian)(dian)的(de)(de)(de)，但(dan)實際上幾乎沒有什么一(yi)(yi)種絕(jue)緣(yuan)(yuan)材料是(shi)不導(dao)電(dian)(dian)(dian)(dian)的(de)(de)(de)。任何一(yi)(yi)種絕(jue)緣(yuan)(yuan)材料，在其(qi)兩(liang)端施(shi)加電(dian)(dian)(dian)(dian)壓，總(zong)會有一(yi)(yi)定(ding)電(dian)(dian)(dian)(dian)流(liu)(liu)通(tong)(tong)過，這種電(dian)(dian)(dian)(dian)流(liu)(liu)的(de)(de)(de)有功分(fen)量叫做泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)，而這種現象也叫做絕(jue)緣(yuan)(yuan)體(ti)的(de)(de)(de)泄(xie)漏(lou)(lou)(lou)。 對于電(dian)(dian)(dian)(dian)器的(de)(de)(de)測試，泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)是(shi)指在沒有故障施(shi)加電(dian)(dian)(dian)(dian)壓的(de)(de)(de)情況下，電(dian)(dian)(dian)(dian)氣中帶相互絕(jue)緣(yuan)(yuan)的(de)(de)(de)金屬零(ling)件之(zhi)間(jian)，或帶電(dian)(dian)(dian)(dian)零(ling)件與接地零(ling)件之(zhi)間(jian)，通(tong)(tong)過其(qi)周圍介質或絕(jue)緣(yuan)(yuan)表(biao)面(mian)所(suo)形成(cheng)(cheng)的(de)(de)(de)電(dian)(dian)(dian)(dian)流(liu)(liu)稱為泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)。按照美國UL標(biao)準，泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)是(shi)包括電(dian)(dian)(dian)(dian)容(rong)耦合電(dian)(dian)(dian)(dian)流(liu)(liu)在內(nei)的(de)(de)(de)，能從(cong)家(jia)用電(dian)(dian)(dian)(dian)器可(ke)觸及部(bu)分(fen)傳導(dao)的(de)(de)(de)電(dian)(dian)(dian)(dian)流(liu)(liu)。泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)包括兩(liang)部(bu)分(fen)，一(yi)(yi)部(bu)分(fen)是(shi)通(tong)(tong)過絕(jue)緣(yuan)(yuan)電(dian)(dian)(dian)(dian)阻的(de)(de)(de)傳導(dao)電(dian)(dian)(dian)(dian)流(liu)(liu)I1;另(ling)一(yi)(yi)部(bu)分(fen)是(shi)通(tong)(tong)過分(fen)布(bu)電(dian)(dian)(dian)(dian)容(rong)的(de)(de)(de)位移電(dian)(dian)(dian)(dian)流(liu)(liu)I2，后者容(rong)抗為XC=1/2pfc與電(dian)(dian)(dian)(dian)源頻率成(cheng)(cheng)反比，分(fen)布(bu)電(dian)(dian)(dian)(dian)容(rong)電(dian)(dian)(dian)(dian)流(liu)(liu)隨(sui)頻率升(sheng)高(gao)而增加，所(suo)以(yi)泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)隨(sui)電(dian)(dian)(dian)(dian)源頻率升(sheng)高(gao)而增加。例如：用可(ke)控硅供(gong)電(dian)(dian)(dian)(dian)，其(qi)諧波分(fen)量使(shi)泄(xie)漏(lou)(lou)(lou)電(dian)(dian)(dian)(dian)流(liu)(liu)增大(da)。

Q:耐(nai)壓測試之漏電流與電源泄漏電流(接觸(chu)電流)有何不同?

A:耐壓(ya)測(ce)試是偵測(ce)流(liu)過被(bei)測(ce)物(wu)絕(jue)緣(yuan)系(xi)統之漏電(dian)(dian)(dian)(dian)流(liu)，以(yi)一高(gao)于工作電(dian)(dian)(dian)(dian)壓(ya)之電(dian)(dian)(dian)(dian)壓(ya)施加于絕(jue)緣(yuan)系(xi)統;而(er)電(dian)(dian)(dian)(dian)源(yuan)泄漏電(dian)(dian)(dian)(dian)流(liu)(接觸電(dian)(dian)(dian)(dian)流(liu))則(ze)是在被(bei)測(ce)物(wu)正(zheng)常(chang)操作下(xia)(xia)，以(yi)一不利的條件(電(dian)(dian)(dian)(dian)壓(ya)、頻率)對被(bei)測(ce)物(wu)量測(ce)漏電(dian)(dian)(dian)(dian)流(liu)。簡(jian)單地說(shuo)，耐壓(ya)測(ce)試之漏電(dian)(dian)(dian)(dian)流(liu)為無工作電(dian)(dian)(dian)(dian)源(yuan)下(xia)(xia)所(suo)(suo)量測(ce)之漏電(dian)(dian)(dian)(dian)流(liu)，電(dian)(dian)(dian)(dian)源(yuan)泄漏電(dian)(dian)(dian)(dian)流(liu)(接觸電(dian)(dian)(dian)(dian)流(liu))為正(zheng)常(chang)操作下(xia)(xia)所(suo)(suo)量測(ce)之漏電(dian)(dian)(dian)(dian)流(liu) 。

Q:接觸電(dian)流的(de)分(fen)類

A:對(dui)于(yu)不(bu)(bu)同結構的(de)電(dian)子產品(pin)，接觸電(dian)流(liu)(liu)的(de)量(liang)測也是有不(bu)(bu)同的(de)要求，但總括來說接觸電(dian)流(liu)(liu)可分(fen)為(wei)對(dui)地接觸電(dian)流(liu)(liu)Ground Leakage Current、表面對(dui)地接觸電(dian)流(liu)(liu)Surface to Line Leakage Current以及表面間接觸電(dian)流(liu)(liu)Surface to Surface Leakage Current測試(shi)三種。

Q:為(wei)什(shen)么要做接(jie)觸電流測試(shi)?

A:對(dui)于 I 類(lei)設備(bei)(bei)的(de)電(dian)(dian)子產品可(ke)觸及的(de)金屬(shu)部件或是(shi)(shi)(shi)外(wai)殼還應具(ju)備(bei)(bei)良好的(de)接(jie)(jie)地線路，以作為基本絕緣以外(wai)的(de)一種防電(dian)(dian)擊保護措施(shi)。但是(shi)(shi)(shi)[size=+0]我(wo)們(men)也經常遇(yu)到(dao)一些(xie)使(shi)用者隨意將 I 類(lei)設備(bei)(bei)當成(cheng) II 類(lei)設備(bei)(bei)使(shi)用，或是(shi)(shi)(shi)說其 I 類(lei)設備(bei)(bei)電(dian)(dian)源(yuan)輸(shu)入端直接(jie)(jie)將接(jie)(jie)地端 (GND) 拔除，這樣就存在一定的(de)安(an)全(quan)隱患(huan)。即便如此，作為生產廠商有義務去避免這種情況對(dui)使(shi)用者造成(cheng)的(de)危險。這就是(shi)(shi)(shi)為什么要(yao)做(zuo)接(jie)(jie)觸電(dian)(dian)流(liu)測試(shi)的(de)目的(de)所在。

Q:為什么耐壓測試之漏電(dian)電(dian)流設定(ding)無一標(biao)準?

A:在AC耐壓(ya)測(ce)試(shi)時因被(bei)測(ce)物(wu)種類不(bu)(bu)同，且被(bei)測(ce)物(wu)內(nei)都會有雜散(san)電容存在以及測(ce)試(shi)電壓(ya)不(bu)(bu)同就會有不(bu)(bu)同的漏電電流(liu)故無一標(biao)準。

Q:如何決定(ding)測試(shi)電壓?

A:決定測(ce)試(shi)電壓(ya)方法就是依據測(ce)試(shi)所需之(zhi)規格設定。一般而言，我們會依2倍的工作(zuo)電壓(ya)加上1000V作(zuo)為測(ce)試(shi)電壓(ya)設定。例(li)如一產(chan)品的工作(zuo)電壓(ya)是115VAC的話，我們就以2 x 115 + 1000 = 1230 Volt作(zuo)為測(ce)試(shi)電壓(ya)。當然，測(ce)試(shi)電壓(ya)也會因絕緣層的等級之(zhi)不同(tong)而有(you)不同(tong)的設定。

Q:絕緣(yuan)阻(zu)抗(IR)測試(shi)是什(shen)么?

A:絕緣(yuan)(yuan)電阻測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)和耐壓測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)非常相似。把高(gao)達1000V的DC電壓施(shi)加到需要測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)的兩(liang)點。IR測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)給出的通(tong)常是(shi)以兆歐為(wei)單(dan)位的電阻值(zhi)，而不是(shi)耐壓測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)得出的Pass / Fail表示。一般典(dian)型的是(shi)，測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)電壓為(wei)500V 直(zhi)流，絕緣(yuan)(yuan)電阻(IR)的值(zhi)不得低于(yu)幾(ji)兆歐。絕緣(yuan)(yuan)阻抗(kang)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)為(wei)非破壞(huai)試(shi)(shi)驗，且能偵測(ce)(ce)(ce)(ce)(ce)絕緣(yuan)(yuan)是(shi)否良好，在某(mou)些規(gui)范中，是(shi)先做絕緣(yuan)(yuan)阻抗(kang)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)再(zai)進行耐壓測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)，而絕緣(yuan)(yuan)阻抗(kang)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)無(wu)法通(tong)過時，往往耐壓測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)也無(wu)法通(tong)過。

Q:接地阻抗(Ground Bond)測試是什么?

A:接(jie)(jie)(jie)地(di)(di)(di)連(lian)接(jie)(jie)(jie)測(ce)(ce)試(shi)，有(you)人稱(cheng)之為接(jie)(jie)(jie)地(di)(di)(di)連(lian)續(xu)性(Ground Continuity)測(ce)(ce)試(shi)，測(ce)(ce)量在(zai)DUT的(de)機(ji)架與接(jie)(jie)(jie)地(di)(di)(di)柱之間(jian)的(de)阻抗。接(jie)(jie)(jie)地(di)(di)(di)連(lian)接(jie)(jie)(jie)測(ce)(ce)試(shi)確定(ding)，該產品要是壞了的(de)話DUT的(de)保護(hu)電路(lu)(lu)是否能夠勝任地(di)(di)(di)處理故(gu)障電流。接(jie)(jie)(jie)地(di)(di)(di)連(lian)接(jie)(jie)(jie)測(ce)(ce)試(shi)器將產生(sheng)通過接(jie)(jie)(jie)地(di)(di)(di)電路(lu)(lu)的(de)，大(da)達到(dao)30A的(de)DC電流或AC 均(jun)方根值電流(CSA要求量測(ce)(ce)40A)，從(cong)而確定(ding)接(jie)(jie)(jie)地(di)(di)(di)電路(lu)(lu)的(de)阻抗，其(qi)一般在(zai)0.1奧姆以下。

Q:耐壓測(ce)試(shi)與絕(jue)緣電(dian)阻測(ce)試(shi)之間有什么不同呢?

A:IR測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)是一(yi)種定性測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，它給(gei)出絕緣系統的(de)相對質(zhi)量的(de)一(yi)個表示。通常用500V或1000V的(de)DC 電(dian)壓(ya)(ya)(ya)進(jin)(jin)行測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，結(jie)果用兆歐電(dian)阻(zu)來(lai)量測(ce)(ce)(ce)。耐(nai)壓(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)也給(gei)被(bei)(bei)測(ce)(ce)(ce)物(DUT)施加(jia)高壓(ya)(ya)(ya)，但(dan)所加(jia)電(dian)壓(ya)(ya)(ya)比IR 測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)的(de)高。其可以在AC或DC電(dian)壓(ya)(ya)(ya)下(xia)進(jin)(jin)行。結(jie)果用毫安培(pei)或微安來(lai)量測(ce)(ce)(ce)。在有些(xie)規格中(zhong)，先(xian)進(jin)(jin)行IR測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，接著再(zai)進(jin)(jin)行耐(nai)壓(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)。如果一(yi)個被(bei)(bei)測(ce)(ce)(ce)物(DUT)無(wu)法(fa)通過(guo)IR測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)，則此被(bei)(bei)測(ce)(ce)(ce)物(DUT)也無(wu)法(fa)通過(guo)在更高的(de)電(dian)壓(ya)(ya)(ya)下(xia)進(jin)(jin)行的(de)耐(nai)壓(ya)(ya)(ya)測(ce)(ce)(ce)試(shi)(shi)(shi)(shi)。

Q:為何(he)接(jie)地阻(zu)抗測試要有開(kai)路(lu)電壓限(xian)制? 為何(he)建議使用(yong)交流(liu)(AC)電流(liu)?

A:接(jie)(jie)地阻抗測(ce)試的(de)(de)目的(de)(de)是要(yao)(yao)確(que)保(bao)當設(she)備(bei)產品發生(sheng)異常狀況時(shi)，保(bao)護接(jie)(jie)地線可(ke)允許承受故障電(dian)流(liu)流(liu)過以(yi)確(que)保(bao)使用者的(de)(de)安全(quan)。安規標準測(ce)試電(dian)壓(ya)要(yao)(yao)求開路電(dian)壓(ya)大值不可(ke)以(yi)超過 12V 的(de)(de)限(xian)制，即(ji)是基于(yu)(yu)使用者的(de)(de)安全(quan)考(kao)慮，一旦被(bei)測(ce)物發生(sheng)測(ce)試故障時(shi)，可(ke)以(yi)減低操作(zuo)人員遭受電(dian)擊的(de)(de)危(wei)險(xian)。而(er)一般標準要(yao)(yao)求接(jie)(jie)地電(dian)阻要(yao)(yao)小于(yu)(yu) 0.1ohm，建議采以(yi)頻率(lv)可(ke)以(yi)選擇 50Hz或(huo) 60Hz 的(de)(de)交流(liu)電(dian)流(liu)測(ce)試 ，以(yi)符合產品實際(ji)的(de)(de)工作(zuo)環境。

Q:耐壓測試與電源泄漏(lou)測試測出(chu)的泄漏(lou)電流兩者(zhe)有(you)什么不同呢?

A:耐壓(ya)測(ce)(ce)試與(yu)電源(yuan)泄(xie)漏(lou)測(ce)(ce)試之間是有一(yi)些(xie)差(cha)異(yi)，但一(yi)般而言, 這(zhe)些(xie)差(cha)別可被概括(kuo)如下。耐壓(ya)測(ce)(ce)試是利(li)用(yong)高電壓(ya)對產品(pin)的(de)(de)絕緣(yuan)加壓(ya)以確(que)定是否(fou)產品(pin)的(de)(de)絕緣(yuan)強(qiang)度足(zu)夠防止(zhi)過量(liang)的(de)(de)泄(xie)漏(lou)電流(liu)。 泄(xie)漏(lou)電流(liu)測(ce)(ce)試是量(liang)測(ce)(ce)產品(pin)在(zai)使用(yong)下，在(zai)正(zheng)常和電源(yuan)單一(yi)故(gu)障狀態下所流(liu)經(jing)產品(pin)的(de)(de)泄(xie)漏(lou)電流(liu)量(liang)。

Q:在直流耐壓測試時(shi)，如何(he)斷定電容性負載的放電時(shi)間?

A:放電時間之不同是視被測試物之電容量以及耐壓測試機之放電電路而定。電容量越大所需的放電時間越長。     //relieved.cn/